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The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
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Measurement of specimen thickness by phase change determination in TEM
M D Croitoru1, D Van Dyck, Y Z Liu
1University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium. mihail.croitoru@ua.ac.be
Ultramicroscopy
|July 29, 2008
Abstract:
A non-destructive method for measuring the thickness of thin amorphous films composed of light elements has been developed. The method employs the statistics of the phase of the electron exit wave function. The accuracy of this method has been checked numerically by the multislice method and compared with that based on the mean inner potential.
