Characteristics of focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron

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Updated: Jul 3, 2026

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
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Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis

Published on: March 29, 2016

Masakazu Oikawa1, Takahiro Satoh, Tomihiro Kamiya

  • 1Department of Advanced Radiation Technology, Japan Atomic Energy Agency (JAEA), 1233 Watanuki-machi, Takasaki, Gunma 370-1292, Japan. oikawa@nirs.go.jp

Applied Radiation and Isotopes : Including Data, Instrumentation and Methods for Use in Agriculture, Industry and Medicine
|August 5, 2008
PubMed

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