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Updated: Jul 3, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Wataru Yashiro1, Yoshihiro Takeda, Atsushi Momose
1Department of Advance Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa, Chiba, Japan. yashiro@mml.k.u-tokyo.ac.jp
X-ray Talbot interferometry (XTI) efficiency was assessed for high-quality phase imaging. Photon statistics determine the detection limit, crucial for optimizing XTI system design.
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