Updated: Jul 3, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Steven J Lascos1, Daniel T Cassidy
1Department of Engineering Physics, McMaster University, Hamilton, Ontario, Canada.
This study introduces digital phase sensitive detectors (PSDs) using Field Programmable Gate Arrays (FPGAs), enabling advanced signal processing. These FPGAs offer enhanced capabilities for precise measurements and multi-signal analysis.
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