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Updated: Jul 2, 2026
07:38
Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
Photoconductivity null apparatus for the determination of minority carrier lifetime
W F Richardson1, J M Meese, R D Westbrook
1Research Reactor Facility, University of Missouri, Columbia, MO 65201, USA.
The Review of Scientific Instruments
|March 1, 1978
Abstract:
A variable time constant exponential pulse generator used to null exponential photoconductivity decay signals is described. Circuitry using this generator for the direct readout of minority carrier lifetime of semiconductors is also presented.
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