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Related Concept Videos

Mass Analyzers: Common Types01:19

Mass Analyzers: Common Types

The quadrupole mass analyzer consists of four cylindrical metal rods arranged in a diamond carrying a DC voltage and a radio-frequency AC voltage. The motion of ions through the quadrupole depends on the field strength, causing only ions of a certain m/z to resonate successfully and strike the detector at a given field strength. Though the transmission rate for these analyzers is high, the exact elemental composition of the sample is not determined because of low resolution; however, they are...
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Related Experiment Video

Updated: Jul 2, 2026

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
07:10

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

Published on: April 29, 2020

Automatic digital data collection for ion scattering depth profiles.

R C McCune1, D W Hoffman, R J Baird

  • 1Engineering and Research Staff--Research, Ford Motor Company, Dearborn, MI 48121, USA.

The Review of Scientific Instruments
|March 1, 1978
PubMed
Summary
This summary is machine-generated.

This study presents a digital method using ion scattering spectrometry to create elemental depth profiles. This technique is effective for materials with clear binary elastic scattering peaks, as demonstrated with a copper-chromium sample.

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Surface Science

Background:

  • Elemental depth profiling is crucial for understanding material composition and structure.
  • Ion scattering spectrometry (ISS) is a surface-sensitive technique for elemental analysis.
  • Acquiring digital depth profiles efficiently remains an area for methodological improvement.

Purpose of the Study:

  • To describe a novel digital method for acquiring elemental depth profiles using ion scattering spectrometry.
  • To enable efficient data acquisition for materials with well-resolved binary elastic scattering peaks.
  • To demonstrate the application of this method for analyzing multi-layered materials.

Main Methods:

  • Utilized ion scattering spectrometry (ISS) for elemental analysis.
  • Developed a digital data acquisition system employing a multichannel scaler and system sweep multiplexer.
  • Integrated counts for elemental peaks and background regions were stored in sequential scaler channels.
  • Employed a time base from the system sweep multiplexer to advance the scaler address.

Main Results:

  • Successfully acquired digital elemental depth profiles.
  • Demonstrated the method's applicability to materials with distinct binary elastic scattering peaks.
  • Presented a depth profile of a copper-chromium bi-layer sample as a representative example.

Conclusions:

  • The described method provides a digital means for obtaining elemental depth profiles via ISS.
  • The technique is suitable for analyzing layered materials with specific scattering characteristics.
  • This approach enhances the efficiency and digital accessibility of ISS depth profiling data.