Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle
Gas Chromatography: Types of Detectors-II
Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview
Atomic Emission Spectroscopy: Instrumentation
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
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Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
Published on: July 27, 2018
F M Bacon1, R W Bickes, J B O'Hagan
1Sandia Laboratories, Albuquerque, NM 87185, USA.
Researchers optimized duopigatron ion source performance by testing design variations. A copper and molybdenum secondary cathode with a mild steel plasma expansion cup yielded the best results, producing high atomic ion content.
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