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Related Concept Videos

Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
X-ray Crystallography02:18

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
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Tandem mass spectrometry is a technique that uses multiple mass analyzers in series to obtain a higher selectivity and reduce chemical noise during analyte detection. Instruments with multiple analyzers separated by an interaction cell enable secondary fragmentation and selected study of the fragment ions.Secondary fragmentations occur in the interaction cell and can be induced by various factors. Fragmentation induced by collision with inert gases, such as N2, Ar, He, etc., is called...
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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on: August 25, 2016

Double axis, two-crystal x-ray spectrometer.

G Erez1, D Kimhi, A Livnat

  • 1Department of Physics, Ben Gurion University of the Negev, Beer Sheva, Israel.

The Review of Scientific Instruments
|May 1, 1978
PubMed
Summary
This summary is machine-generated.

A new two-crystal double axis x-ray spectrometer was developed with enhanced goniometric accuracy. Its innovative design features precise coupling, a refined tangent drive, and automatic step scanning for improved performance.

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Area of Science:

  • Crystallography
  • Materials Science
  • Spectroscopy

Background:

  • X-ray diffraction is a crucial technique in materials science and crystallography.
  • High-precision spectrometers are essential for accurate crystallographic analysis.
  • Existing spectrometer designs may have limitations in accuracy and mechanical stability.

Purpose of the Study:

  • To develop a novel two-crystal double axis x-ray spectrometer.
  • To achieve high goniometric accuracy (on the order of 0.1 arcseconds).
  • To present unique design features that enhance precision and control.

Main Methods:

  • Utilized a modified commercial thrust bearing for precise theta:2theta coupling.
  • Implemented a new tangent drive system with reduced lead screw effective pitch.
  • Incorporated an automatic step scanning control system linked to tangent arm displacement.

Main Results:

  • The developed spectrometer achieves goniometric accuracy of approximately 0.1 arcseconds.
  • The modified thrust bearing provides precise, full-circle coupling.
  • The new tangent drive and automatic scanning system minimize mechanical deficiencies.

Conclusions:

  • The novel spectrometer design offers superior goniometric accuracy and stability.
  • The integrated features provide precise control for x-ray diffraction studies.
  • This instrument advances the capabilities for crystallographic and materials analysis.