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Updated: Jul 2, 2026

Synthesis and Microdiffraction at Extreme Pressures and Temperatures
Published on: October 7, 2013
High-pressure-low-temperature x-ray power diffractometer
1Max-Planck-Institut fur Festkorperforschung 7 Stuttgart 80, Federal Republic of Germany.
Abstract:
A high-pressure technique for x-ray diffraction studies at low temperatures is described. The system consists of a Bridgman anvil type high-pressure device with either tungsten carbide or boron carbide anvils, a liquid He cryostat, and x-ray diffractometer operating in Debye-Scherrer geometry. The newly developed boron carbide anvil cell is capable of containing a liquid pressure transmitting medium. The precision of the lattice parameter determination is discussed and the effect of nonisostatic stress components on the diffraction pattern is examined.
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