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Updated: Jul 2, 2026

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Infrared optical sensor for measuring internal interfacial wave motions.

C G Koop¹, H Rungaldier, J D Sherman

¹TRW Defense and Space Systems Group, Redondo Beach, California 90278.

The Review of Scientific Instruments

|January 1, 1979

Summary

This study introduces an infrared probe for measuring fluid interface movements. The sensor accurately detects small wave motions, enabling precise interfacial displacement measurements.

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Area of Science:

Physics
Engineering
Materials Science

Background:

Interfacial displacements are crucial in fluid dynamics.
Accurate measurement of these displacements is essential for understanding various physical phenomena.

Purpose of the Study:

To develop and present an infrared-based sensing system.
To measure internal interfacial displacements with high sensitivity.

Main Methods:

Utilized infrared energy absorption for displacement inference.
Employed a pulsed infrared emitting diode and a silicon photodiode detector.
Developed multiplexing electronics to manage up to eight probes.

Main Results:

Achieved a sensor sensitivity of approximately 1 V/cm.
Demonstrated the ability to resolve wave motions as small as 0.01 mm.
The system effectively measures interfacial displacements.

Conclusions:

The infrared probe offers a sensitive and accurate method for measuring interfacial displacements.
This technology can be applied to resolve small-scale wave motions in fluids.