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100-MHz noise spectrometer.

R Rzemien1, C K Iddings, W F Love

  • 1Department of Physics and Astrophysics, University of Colorado, Boulder, Colorado 80309.

The Review of Scientific Instruments
|April 1, 1979
PubMed
Summary
This summary is machine-generated.

A new 100-MHz noise spectrometer measures impedance fluctuations. This instrument reveals spectral densities in both real and imaginary impedance parts, along with their correlation.

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Area of Science:

  • Electrical Engineering
  • Physics
  • Materials Science

Background:

  • Understanding material impedance is crucial for electronic device performance.
  • Characterizing noise in impedance is essential for sensitive measurements.

Purpose of the Study:

  • To present the design, construction, and performance of a novel 100-MHz noise spectrometer.
  • To enable measurement of spectral densities of impedance fluctuations.

Main Methods:

  • A 100-MHz bridge utilizing a double-balanced mixer.
  • Detailed calibration circuits and techniques for accurate measurements.
  • Analysis of spectral densities in real and imaginary impedance components.

Main Results:

  • Demonstrated the capability to measure fluctuations in both real and imaginary parts of sample impedance.
  • Observed partial correlation between the real and imaginary impedance fluctuations.
  • Validated performance using commercial 50-Ohm terminators.

Conclusions:

  • The developed noise spectrometer effectively characterizes impedance fluctuations.
  • The instrument provides insights into the dynamic properties of materials at 100 MHz.
  • Results highlight the importance of considering both real and imaginary impedance components in noise analysis.