Thermal conductivity comparison method based on silicon diode thermometry

Area of Science:

• Materials Science
• Thermodynamics
• Measurement Science

Background:

• Accurate thermal conductivity measurement is crucial for material selection and performance.
• Existing methods often require calibrated thermometers and significant temperature differentials.
• A simplified, room-temperature method is needed for broader accessibility.

Purpose of the Study:

• To present a novel room-temperature method for comparing thermal conductivity.
• To demonstrate the method's efficacy using silicon diode thermometry.
• To assess the uncertainty and potential improvements of the technique.

Main Methods:

• Developed a comparative thermal conductivity measurement technique.
• Utilized silicon diode thermometry for precise temperature monitoring (<1 K rise).
• Measured three unknown samples against an alumina standard.

Main Results:

• Achieved a room-temperature thermal conductivity comparison method.
• Demonstrated an approximate uncertainty of +/-5% for short samples.
• Successfully measured thermal conductivity of unknown materials relative to alumina.

Conclusions:

• The described method offers a viable alternative for thermal conductivity comparison without calibrated thermometers.
• The technique is suitable for short samples with manageable uncertainty.
• Potential exists for adaptation to other temperatures and accuracy enhancements.