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Related Experiment Video

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Confocal Microscopy Reveals Cell Surface Receptor Aggregation Through Image Correlation Spectroscopy

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Measurement method of aberration from Ronchigram by autocorrelation function.

H Sawada¹, T Sannomiya, F Hosokawa

¹CREST, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan. hsawada@jeol.co.jp

Ultramicroscopy

|August 22, 2008

Summary

Fifth-order aberrations were measured using Ronchigram analysis in a new 300kV microscope. This method accurately characterized aberrations, validating the spherical aberration corrector

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Area of Science:

Electron microscopy
Optical physics

Background:

Accurate aberration measurement is crucial for high-resolution electron microscopy.
Spherical aberration correctors enhance imaging performance but require precise calibration.

Purpose of the Study:

To measure high-order aberrations in a novel 300kV microscope.
To validate the performance of a spherical aberration corrector for probe-forming systems.

Main Methods:

Utilized an autocorrelation function of segmental Ronchigram areas for aberration measurement.
Applied the method to a new 300kV microscope equipped with a spherical aberration corrector.
Calculated simulated Ronchigrams using measured aberrations for comparison.

Main Results:

Successfully measured aberrations up to the fifth-order.
Experimental Ronchigrams showed excellent agreement with simulated ones.
Demonstrated an infinite magnification area with a 50mrad half-angle.

Conclusions:

The autocorrelation method is effective for measuring high-order aberrations.
The new 300kV microscope with a spherical aberration corrector performs as expected.
Validated the accuracy of aberration measurement for advanced electron microscopy.