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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.

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Updated: Jul 2, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy.

Sam M Stevens1, Pablo Cubillas, Kjell Jansson

  • 1Centre for Nanoporous Materials, School of Chemistry, The University of Manchester, Chemistry Building, Oxford Road, Manchester, UK. sammichaelstevens@mac.com

Chemical Communications (Cambridge, England)
|August 30, 2008
PubMed
Summary
This summary is machine-generated.

High-resolution scanning electron microscopy (HRSEM) was evaluated using atomic force microscopy (AFM) data. This assessment helps determine HRSEM

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Last Updated: Jul 2, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
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Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy
10:29

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy

Published on: February 5, 2017

Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Nanoporous crystals are crucial in various applications, including catalysis and separation.
  • Understanding their growth mechanisms at the nanoscale is essential for optimizing material properties.
  • Accurate characterization techniques are vital for studying crystal morphology and surface topography.

Purpose of the Study:

  • To evaluate the resolving power of high-resolution scanning electron microscopy (HRSEM).
  • To assess HRSEM's utility in characterizing nanoporous crystal growth.
  • To compare HRSEM topographical data with atomic force microscopy (AFM) height data.

Main Methods:

  • Utilizing topographical height data obtained from atomic force microscopy (AFM).
  • Analyzing high-resolution scanning electron microscopy (HRSEM) images.
  • Comparing and correlating data from both HRSEM and AFM.

Main Results:

  • The resolving power of HRSEM was quantitatively judged against AFM data.
  • The study provides insights into the capabilities of HRSEM for nanoporous materials.
  • Topographical height data from AFM served as a benchmark for HRSEM resolution.

Conclusions:

  • HRSEM, when validated with AFM data, can be a valuable tool for studying nanoporous crystal growth.
  • The findings contribute to the understanding of nanoscale characterization techniques.
  • This comparative approach enhances the reliability of structural analysis in materials science.