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Updated: Jul 2, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
F Mert Sasoglu1, Andrew J Bohl, Kathleen B Allen
1Drexel University, Department of Mechanical Engineering and Mechanics, 3141 Chestnut Street, Philadelphia, PA 19104, USA.
This study introduces an image analysis method for tracking mechanical force sensor displacements. The technique accurately measures forces on cellular structures, with applications in mechanotransduction research.
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