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Updated: Jul 1, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with

C Kisielowski1, B Freitag, M Bischoff

  • 1National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, One Cyclotron Rd., Berkeley, CA 94720, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 17, 2008
PubMed

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