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Fast approximation of transfer cross coefficient for optical proximity correction
Romuald Sabatier1, Caroline Fossati, Salah Bourennane
1Institut Fresnel, Ecole Centrale Marseille, CNRS UMR 6133, Marseille Cedex 20, France.
Optics Express
|September 17, 2008
Summary
Model Based Optical Proximity Correction (MBOPC) uses computationally intensive Singular Value Decomposition. This study introduces a faster fixed-point algorithm to estimate eigenvectors, reducing runtime for aerial image computation in photolithography.
Area of Science:
- Semiconductor manufacturing
- Computational lithography
- Image processing
Background:
- Model Based Optical Proximity Correction (MBOPC) is crucial for achieving sub-wavelength resolutions in photolithography.
- Current MBOPC methods rely on computationally expensive Singular Value Decomposition (SVD) for Transfer Cross Coefficient (TCC) analysis.
- Shrinking pattern dimensions necessitate efficient computational techniques.
Purpose of the Study:
- To develop a faster algorithm for Model Based Optical Proximity Correction.
- To reduce the computational runtime of aerial image calculations in MBOPC.
- To maintain accuracy and minimize information loss during eigenvector estimation.
Main Methods:
- Extension of a fast fixed-point algorithm.
- Estimation of a fixed number of leading eigenvectors for TCC decomposition.
- Application to aerial image computation in MBOPC.
Main Results:
- The proposed fixed-point algorithm offers a significant speed-up compared to traditional SVD methods.
- Accurate approximation of aerial images with minimal information loss is achieved.
- The method effectively handles the decomposition of TCC into eigenvectors.
Conclusions:
- The developed fast fixed-point algorithm provides an efficient alternative for MBOPC.
- This advancement can accelerate the design and manufacturing of advanced semiconductor devices.
- The technique ensures high-fidelity aerial image computation essential for sub-wavelength lithography.
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