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Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
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Published on: January 26, 2016

Refractive index and extinction coefficient determination of an absorbing thin film by using the continuous wavelet

Emre Coşkun1, Kivanç Sel, Serhat Ozder

  • 1Department of Physics, Canakkale Onsekiz Mart University, 17100 Canakkale, Turkey.

Applied Optics
|September 23, 2008
PubMed

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