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Updated: Jun 30, 2026

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Published on: September 22, 2017
An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 2. Interpretation and
Ch Morawe1, J-P Guigay, V Mocella
1ESRF, F-38043 Grenoble cedex, France. morawe@esrf.fr
Abstract:
Aberration effects are studied in parabolic and elliptic multilayer mirrors for hard x-rays, basing on a simple analytical approach. The interpretation of the underlying equations provides insight into fundamental limitations of the focusing properties of curved multilayers. Using realistic values for the multilayer parameters the potential impact on the broadening of the focal spot is evaluated. Within the limits of this model, systematic contributions to the spot size can be described. The work is complemented by a comparison with experimental results obtained with a W/B(4)C curved multilayer mirror.
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