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Updated: Jun 29, 2026

Applying Hyperspectral Reflectance Imaging to Investigate the Palettes and the Techniques of Painters
Published on: June 18, 2021
Statistical characterization of hyperspectral background clutter in the reflective spectral region
Dimitris Manolakis1, Michael Rossacci, Denise Zhang
1MIT Lincoln Laboratory, 244 Wood Street, Lexington, Massachusetts 02420, USA. dmanolakis@ll.mit.edu
Abstract:
Hyperspectral imaging systems for daylight operation measure and analyze reflected and scattered radiation in p-spectral channels covering the reflective infrared region 0.4-2.5 microm. Consequently, the p-dimensional joint distribution of background clutter is required to design and evaluate optimum hyperspectral imaging processors. In this paper, we develop statistical models for the spectral variability of natural hyperspectral backgrounds using the class of elliptically contoured distributions. We demonstrate, using data from the NASA AVIRIS sensor, that models based on the multivariate t-elliptically contoured distribution capture with sufficient accuracy the statistical characteristics of natural hyperspectral backgrounds that are relevant to target detection applications.
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