Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Serum ferritin critical threshold fluctuations predict antipsychotic treatment discontinuation in pediatric Tic disorders: a retrospective cohort study.

Frontiers in pediatrics·2026
Same author

Tetrandrine-based in situ vaccination via multifunctional Mn²⁺-hyaluronic acid hydrogel loading gelatinase-responsive nanoparticles.

Journal of nanobiotechnology·2026
Same author

Biomimetic M1 Macrophage Membrane-Camouflaged Nanoplatform Remodels Tumor Microenvironment for Enhanced Antitumor Immunity.

International journal of nanomedicine·2026
Same author

Decoding the role of CXC chemokines in pulmonary metastasis of colorectal cancer using integrative computational approaches.

Naunyn-Schmiedeberg's archives of pharmacology·2026
Same author

A tumor-targeting gambogic acid-loaded nanovaccine reprograms the tumor microenvironment for enhanced cancer immunotherapy.

Journal of materials chemistry. B·2026
Same author

Application of radiotherapy-preexcited gambogic acid dual targeting nanoparticles in colorectal cancer.

RSC advances·2025

Related Experiment Video

Updated: Jun 29, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Blind estimation of general tip shape in AFM imaging.

Fenglei Tian1, Xiaoping Qian, J S Villarrubia

  • 1Mechanical, Materials and Aerospace Engineering, Illinois Institute of Technology, Chicago, IL 60616, USA. ftian1@iit.edu

Ultramicroscopy
|October 7, 2008
PubMed
Summary

Advanced atomic force microscopes (AFM) can now image complex surfaces. This study introduces a new method to accurately estimate the 3D tip shape, correcting image distortions for better surface analysis.

More Related Videos

Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy (Conpokal) on Live Cells
09:20

Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy (Conpokal) on Live Cells

Published on: August 11, 2020

Quantitative Hardness Measurement by Instrumented AFM-indentation
08:21

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Related Experiment Videos

Last Updated: Jun 29, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy (Conpokal) on Live Cells
09:20

Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy (Conpokal) on Live Cells

Published on: August 11, 2020

Quantitative Hardness Measurement by Instrumented AFM-indentation
08:21

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Area of Science:

  • Surface science
  • Nanotechnology
  • Microscopy

Background:

  • Atomic Force Microscopy (AFM) enables imaging of nanoscale structures.
  • AFM images suffer from tip-induced distortions, necessitating tip shape correction.
  • Recent AFMs with flared tips and bi-directional servo control can image complex surfaces, including undercuts.

Purpose of the Study:

  • To develop a noise-tolerant method for estimating general 3D tip shapes in advanced AFMs.
  • To extend existing blind tip estimation techniques for improved accuracy.
  • To enable accurate imaging of surfaces with reentrant features and undercut lines.

Main Methods:

  • Utilizing a dexel-based representation for samples, images, and tips to describe general 3D shapes.
  • Extending an existing blind tip estimation algorithm.
  • Implementing a noise-tolerant approach for robust tip shape estimation.

Main Results:

  • Successfully estimated general 3D tip shapes from AFM images.
  • The method accurately reconstructs tip shapes, including those with reentrant features.
  • Demonstrated the capability to correct tip-induced distortions in AFM images.

Conclusions:

  • The presented approach enables accurate 3D tip shape estimation for advanced AFMs.
  • This method facilitates the correction of image distortions caused by finite tip sizes.
  • It opens possibilities for high-resolution imaging of complex nanostructures with undercut features.