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Published on: May 21, 2016
Two-probe electrical measurements in transmission electron microscopes--behavioral control of tungsten microwires
Pedro M F J Costa1, Xiaosheng Fang, Shiliang Wang
1Nanoscale Materials Center, National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-044, Japan. pedromfjcosta@ua.pt
Abstract:
Tungsten microwires have been manipulated and electrically probed inside a transmission electron microscope. Using Au electrodes, the current-voltage characteristics of the W structures were extracted. These showed highly variable behaviors dependent on various factors, the most important of these being orientation and stiffness of the contact. Careful control of loading force and Au-W contact angle enabled a considerable degree of behavior tailoring from nonlinear to Ohmic responses.

