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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
High-electron-temperature diagnostics of transient ionizing plasma using near-uv transitions
Ramy Doron1, Ron Arad, Vladimir Bernshtam
1Faculty of Physics, Weizmann Institute of Science, Rehovot 76100, Israel.
Abstract:
We present spectroscopic measurements in which utilized are line-intensity ratios in the near-uv to measure electron energies of several hundred eVs, which usually necessitates the use of emission in the soft x-ray region. The main intensity ratio selected is of the BIII transition 1s(2)2s2S(1/2)-1s(2)2p2P3/2 (2066A) and the BIV transition 1s2s3S(1)-1s2p3P2 (2822A). A detailed atomic-kinetics modeling is made to demonstrate the usefulness of this atomic system for studying transient, ionizing plasmas. Here, it is applied for the characterization of high-electron energies (approximately 500 eV) generated due to the rapid penetration of a magnetic field pulse into a low-collisionality plasma. Limitations of the use of the method are discussed.
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