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Updated: Jun 28, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Low-cost virtual instrumentation system of an energy-dispersive X-ray spectrometer for a scanning electron microscope

Junfeng Lei1, Libo Zeng, Ronggui Liu

  • 1Department of Analysis-Measurement Science, Wuhan University, Wuhan 430072, PR China.

Journal of Automated Methods & Management in Chemistry
|October 18, 2008
PubMed

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