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Updated: Jun 28, 2026

11:14
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Defect chemistry of polyfluorenes: identification of the origin of "interface defects" in polyfluorene based
Stefan Kappaun1, Horst Scheiber, Roman Trattnig
1NanoTecCenter Weiz Forschungsgesellschaft mbH, Franz-Pichler-Strasse 32, Weiz, A-8160, Austria. stefan.kappaun@ntc-weiz.at
Abstract:
Deprotonation of hydroxy terminated polyfluorenes results in a greenish emission also providing a rational explanation for so called "interface defects" in polymeric light-emitting devices (PLEDs).
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