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Atom Probe Tomography Analysis of Exsolved Mineral Phases

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Published on: October 25, 2019

Spark-source mass-spectrometric sensitivity factors for elements in a graphite matrix.

B Vanderborght¹, R Van Grieken

¹Department of Chemistry, University of Antwerp (U.I.A.), B-2610 Wilrijk, Belgium.

|June 1, 1979

Summary

This study measured relative sensitivity factors for 41 elements using spark-source mass spectrometry. These factors, crucial for accurate elemental analysis, were determined with an overall error of 30% and mean precision of 16%.

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Area of Science:

Analytical Chemistry
Materials Science
Spectroscopy

Background:

Accurate elemental analysis is critical in various scientific fields.
Spark-source mass spectrometry (SSMS) is a powerful technique for multi-elemental determination.
Establishing reliable sensitivity factors is essential for quantitative SSMS.

Purpose of the Study:

To determine relative sensitivity factors (RSFs) for 41 elements using SSMS.
To assess the precision and accuracy of these RSFs.
To provide a valuable dataset for quantitative elemental analysis.

Main Methods:

Samples were prepared by pressing into graphite electrodes.
Ionization was achieved using a radiofrequency spark.
Mass spectra were recorded on photoplates and processed by computer.
Indium was used as the internal standard for RSF determination.

Main Results:

Relative sensitivity factors were determined for 41 elements.
RSFs were calculated for both singly- and doubly-charged ions.
Indium (singly-charged ion) was used as the reference standard.
An overall error of 30% was achieved for the RSF determination.
The mean analysis precision was determined to be 16%.

Conclusions:

The study successfully determined RSFs for a wide range of elements using SSMS.
The established RSFs provide a basis for more accurate quantitative elemental analysis.
The achieved precision and error levels are important considerations for data interpretation.