Related Experiment Video

Updated: Jun 28, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
05:57

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

Design and characterization of an intensified diode array data-acquisition system for spectrometric measurements

M Ryan-Hotchkiss1, J D Ingle

  • 1Department of Chemistry, Oregon State University, Corvallis, Oregon 97331, U.S.A.

Talanta
|July 1, 1987
PubMed

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