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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Simultaneous multielement atomic-emission spectrometry with a charge-injection device detector.
1Department of Chemistry, University of Arizona, Tucson, AZ 85721, U.S.A.
Talanta
|January 1, 1990
Summary
This study introduces a charge-injection device (CID) detector for simultaneous multielement atomic-emission spectrometry. The CID detector demonstrates high sensitivity and accuracy for analyzing multiple elements in complex samples.
Area of Science:
- Analytical Chemistry
- Spectroscopy
- Atomic Emission Spectrometry
Background:
- Multielement analysis requires sensitive and accurate detection methods.
- Traditional optical detectors can have limitations in simultaneous elemental determination.
Purpose of the Study:
- To describe a simultaneous multielement atomic-emission spectrometry system utilizing a charge-injection device (CID) as a detector.
- To evaluate the performance, accuracy, and sensitivity of the CID detector for elemental analysis.
Main Methods:
- Utilized a direct current (D.C.) plasma source and a modified echelle spectrometer.
- Employed a digital camera system with a two-dimensional CID array sensor for spectral acquisition.
- Developed computer algorithms for spectral data processing and analysis.
Main Results:
- Simultaneously determined detection limits for several elements.
- Successfully analyzed multiple elements in an NBS standard reference material (SRM 1643A).
- Demonstrated good accuracy and high sensitivity of the CID detector in complex sample matrices.
Conclusions:
- The CID detector is a viable and effective tool for simultaneous multielement atomic-emission spectrometry.
- The developed system offers high sensitivity and accuracy for analyzing complex samples.
- This technology advances the capabilities of elemental analysis in various applications.
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