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Atomic Emission Spectroscopy: Instrumentation

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers. Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.

Atomic Emission Spectroscopy: Lab

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...

Atomic Emission Spectroscopy: Interference

Atomic Emission Spectroscopy: Interference

In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...

Atomic Emission Spectroscopy: Overview

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...

Atomic Absorption Spectroscopy: Instrumentation

Atomic Absorption Spectroscopy: Instrumentation

An atomic absorption spectrophotometer (AAS) comprises several components: a radiation source, an atomizer, a monochromator, and a detector. The radiation source can be a hollow-cathode lamp (HCL) or an electrodeless-discharge lamp (EDL), both of which provide a narrow emission line of the required wavelength. However, some instruments use continuum sources and high-resolution monochromators to achieve a narrow range of radiation.
The atomizer used in AAS can be either a flame atomizer or an...

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Updated: Jun 28, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F⁻

Published on: July 27, 2018

Charge-injection device detection for improved performance in atomic-emission spectroscopy.

R S Pomeroy¹, J V Sweedler, M B Denton

¹Department of Chemistry, University of Arizona, Tucson, AZ 85721, U.S.A.

|January 1, 1990

Summary

Charge-injection devices enhance atomic emission spectrometry (AES) for multi-element analysis. This advanced detection improves sensitivity and reliability, enabling easier monitoring of plasma conditions and matrix effects.

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Last Updated: Jun 28, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F⁻

Published on: July 27, 2018

Coulomb Explosion Imaging as a Tool to Distinguish Between Stereoisomers

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Published on: August 18, 2017

Preparing an Isotopically Pure 229Th Ion Beam for Studies of 229mTh

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Published on: May 3, 2019

Area of Science:

Analytical Chemistry
Spectroscopy

Background:

Atomic emission spectrometry (AES) traditionally faces challenges in sensitivity and real-time condition monitoring.
Simultaneous multiwavelength detection offers potential for improved analytical performance.

Purpose of the Study:

To evaluate the utility of a charge-injection device (CID) coupled with an echelle monochromator for simultaneous multiwavelength detection in AES.
To assess the CID's capability for multi-line analysis and its application in monitoring plasma and matrix conditions.

Main Methods:

Utilized an echelle monochromator and a General Electric CID17B array detector with a direct current plasma source.
Performed simultaneous multiwavelength detection across a broad spectral range (220-520 nm).
Monitored emission lines for elements (Mg, Sr, Fe, Dy, Ho, Yb), OH band, Ar lines, and C(I) for diagnostic purposes.

Main Results:

Achieved increased sensitivity and improved limits of detection for multiple elements.
Demonstrated effective detection of nebulization and excitation condition changes via OH and Ar emission lines.
Successfully identified the presence of an organic matrix component using C(I) emission, which was absent in standards.

Conclusions:

The charge-injection device provides a powerful and flexible detection system for atomic emission spectrometry.
Simultaneous multiwavelength detection with CID offers enhanced diagnostic capabilities for real-time monitoring of analytical conditions.
Integration of these diagnostic tools with internal standards significantly improves the reliability of automated AES instrumentation.