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Updated: Jun 28, 2026

A Practical Guide on Coupling a Scanning Mobility Sizer and Inductively Coupled Plasma Mass Spectrometer (SMPS-ICPMS)

A Practical Guide on Coupling a Scanning Mobility Sizer and Inductively Coupled Plasma Mass Spectrometer (SMPS-ICPMS)

Published on: July 11, 2017

Correcting sensitivity drift during long-term multi-element signal measurements by solid sampling-ETV-ICP-MS.

A Martin-Esteban¹, B Slowikowski, K H Grobecker

¹Institute for Reference Materials and Measurements, Joint Research Centre, European Commission, Retieseweg, B-2440 Gel, Belgium.

|October 31, 2008

Summary

Directly analyzing solid samples using electrothermal vaporisation-inductively coupled plasma-mass spectrometry (SS-ETV-ICP-MS) can suffer from sensitivity drift. A combination of argon dimer internal standard and modified ETV-ICP connection tube stabilizes sensitivity for trace element analysis.

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A Practical Guide on Coupling a Scanning Mobility Sizer and Inductively Coupled Plasma Mass Spectrometer (SMPS-ICPMS)

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Using a Cyclic Ion Mobility Spectrometer for Tandem Ion Mobility Experiments

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Published on: January 20, 2022

Area of Science:

Analytical Chemistry
Environmental Science

Background:

Solid sampling-electrothermal vaporisation-inductively coupled plasma-mass spectrometry (SS-ETV-ICP-MS) enables direct trace element determination in solids.
Long-term studies, such as reference material homogeneity assessment, reveal instrument sensitivity drift.
Deposits on cones and ion lenses are the likely cause of this sensitivity decrease.

Purpose of the Study:

To propose and evaluate methods for correcting and suppressing sensitivity drift in SS-ETV-ICP-MS.
To monitor trace elements (Cd, Cu, Hg, Mn, Pb, Sb, Se, Sn, Tl, U, V) in diverse reference materials.
To identify optimal strategies for stable instrument performance during extended analytical runs.

Main Methods:

Implementation of SS-ETV-ICP-MS for direct solid sample analysis.
Investigation of various drift correction and suppression techniques.
Utilisation of the argon dimer as an internal standard.
Modification of the electrothermal vaporisation-inductively coupled plasma (ETV-ICP) connection tube.

Main Results:

Several methods were evaluated for their effectiveness in mitigating sensitivity drift.
The combined approach of using argon dimer and modifying the ETV-ICP connection tube proved most effective.
Stable instrument sensitivity was achieved for at least 60 consecutive ETV runs.

Conclusions:

The proposed method significantly improves the reliability of SS-ETV-ICP-MS for long-term trace element analysis.
This technique is crucial for accurate homogeneity assessment of reference materials.
The findings offer a practical solution for enhancing the stability and usability of SS-ETV-ICP-MS.