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Updated: Jun 24, 2026

High-speed Particle Image Velocimetry Near Surfaces
Published on: June 24, 2013
Mark A Foster1, Reza Salem, David F Geraghty
1School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA.
Researchers developed a new silicon photonics technique for ultrafast optical waveform measurement. This method achieves 220-fs resolution, enabling advanced optical signal processing and metrology applications.
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