Beam deflection and scanning by two-mirror and two-axis systems of different architectures: a unified approach

Yajun Li1

  • 1yajun_li@yahoo.com

Applied Optics
|November 13, 2008
PubMed

Related Concept Videos

Deflection of a Beam01:19

Deflection of a Beam

Accurately determining beam deflection and slope under various loading conditions in structural engineering is crucial for ensuring safety and structural integrity. Singularity functions offer a streamlined approach to analyzing beams, especially when multiple loading functions complicate the bending moment equation.
Singularity functions, described in an earlier lesson, are powerful mathematical tools that represent discontinuities within a function commonly encountered in structural loading...
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Beams with Unsymmetric Loadings01:17

Beams with Unsymmetric Loadings

Analyzing a supported beam under unsymmetrical loadings is essential in structural engineering to understand how beams respond to varied force distributions. This analysis involves calculating the deflection and identifying points where the slope of the beam is zero, which are crucial for ensuring structural stability and functionality.
The first moment-area theorem determines the slope at any point on the beam. This theorem indicates that the change in slope between two points on a beam...
Deformation of a Beam under Transverse Loading01:15

Deformation of a Beam under Transverse Loading

Understanding beam deflection, particularly for indeterminate beams with overhanging segments and multiple concentrated loads, is crucial for ensuring structural integrity and functionality. The process begins with constructing an accurate free-body diagram, which helps identify the forces and moments acting on the beam. This diagram is vital for visualizing how bending moments vary along the beam's length, influencing its curvature.
The insights from the bending moment diagram extend to...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...