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Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Absolute testing of the reference surface of a Fizeau interferometer through even/odd decompositions.
R Schreiner1, J Schwider, N Lindlein
1Jenoptik Laser, Optik, Systeme GmbH, Goeschwitzer Strasse 25, D-07745 Jena, Germany.
Applied Optics
|November 13, 2008
Summary
This study validates an absolute testing method for spherical reference surfaces in Fizeau interferometers. The technique accurately measures surface deviations, crucial for high-precision optical manufacturing.
Area of Science:
- Optical Engineering
- Metrology
Background:
- Absolute testing of spherical surfaces is critical due to rising accuracy demands.
- In Fizeau interferometry, reference surface errors significantly impact measurements.
Purpose of the Study:
- To demonstrate the validity of a previously proposed absolute testing procedure for reference surfaces.
- To address the challenge of accurate spherical surface metrology.
Main Methods:
- The procedure decomposes surface deviations into odd and even components.
- Odd deviations are measured using a basic and a 180-degree rotated auxiliary sphere.
- Even deviations are determined via a cat's eye double-pass configuration with a half-screen aperture.
Main Results:
- The study confirms the effectiveness of the absolute testing method for reference surfaces.
- The decomposition technique allows for accurate separation of surface error contributions.
- The method is compatible with partially coherent illumination.
Conclusions:
- The validated absolute testing procedure provides a reliable method for characterizing spherical reference surfaces.
- This technique enhances the accuracy of Fizeau interferometry.
- It is applicable in various metrology contexts requiring high precision.
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