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Updated: Jun 28, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Absolute testing of the reference surface of a Fizeau interferometer through even/odd decompositions
R Schreiner1, J Schwider, N Lindlein
1Jenoptik Laser, Optik, Systeme GmbH, Goeschwitzer Strasse 25, D-07745 Jena, Germany.
Abstract:
Absolute testing of spherical surfaces is a technological necessity because of increased accuracy requirements. In a Fizeau setup, the main part of the interferometer deviations thereby comes from the reference surface. We demonstrate the validity of an absolute testing procedure for the reference surface that has been proposed earlier. The procedure relies on the decomposition of the surface deviations into odd and even parts and could be used in partially coherent illumination. The odd deviations are obtained from a basic and a 180 degree-rotated position of an auxiliary sphere, and the even deviations can be measured with the help of a cat's eye position in double pass using an opaque half screen in the interferometer aperture.
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