Total Internal Reflection Fluorescence Microscopy
Super-resolution Fluorescence Microscopy
Three-Dimensional Microscopy in Microbiology
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M Beck1, M Aschwanden, A Stemmer
1Nanotechnology Group, Department of Mechanical and Process Engineering, ETH Zurich, Tannenstrasse 3, 8092 Zurich, Switzerland.
This study introduces a new method combining total internal reflection fluorescence microscopy and structured illumination for high-resolution imaging. The technique achieves a lateral resolution of 89 nm, enabling detailed visualization of sub-100-nanometre structures.
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