Related Experiment Video
Updated: Jun 27, 2026

Application of Voltage in Dynamic Light Scattering Particle Size Analysis
Published on: January 24, 2020
Characterization of precipitates size distribution: validation of low-voltage STEM
D Acevedo-Reyes1, M Perez, C Verdu
1Université de Lyon, INSA Lyon, MATEIS: UMR CNRS 5510, F69621 Villeurbanne, France.
Abstract:
The size distribution of second phase precipitates is frequently determined using conventional transmission electron microscopy (CTEM). However, other techniques, which present different advantages, can also be used for this purpose. In this paper, we focus on high angle annular dark field (HAADF) in TEM and scanning TEM (STEM) in scanning electron microscopy (SEM) imaging modes. The mentioned techniques will be first described, then compared to more conventional ones for the measurement of carbides size distribution in two FeCV and FeCVNb model alloys. This comparative study shows that STEM in SEM, a technique much easier to undertake compared to TEM, is perfectly adapted for size distribution measurements of second phase particles, with sizes ranging between 5 and 200 nm in these systems.
Related Concept Videos
Precipitate Formation and Particle Size Control
The obtained precipitate should be either a pure substance of known composition or easily converted to one by a simple process, such as ignition or drying. In addition, the precipitate should be insoluble and easily filterable. In general, filterability...
Washing, Drying, and Ignition of Precipitates
Colloidal precipitates
Precipitation Processes

