Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0110]

K Du1, M Rühle

  • 1Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, 110016 Shenyang, China. kuidu@imr.ac.cn

Journal of Microscopy
|November 20, 2008
PubMed

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