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Updated: Jun 27, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
07:38

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

Free carrier lifetime modification for silicon waveguide based devices

N M Wright1, D J Thomson, K L Litvinenko

  • 1Advanced Technology Institute, University of Surrey, Guildford, GU2 7XH, UK. Nicholas.wright@surrey.ac.uk

Optics Express
|November 26, 2008
PubMed

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