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Updated: Jun 27, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Direct measurement of group delay with joint time-frequency analysis of a white-light spectral interferogram
Yuqiang Deng1, Weijian Yang, Chun Zhou
1Institute of Quantum Electronics, State Key Laboratory of Advanced Optical Communication System and Networks, School of Electronics Engineering and Computer Science, University of Beijing, Beijing 100871, China. yqdeng@nim.ac.cn
Abstract:
We propose and demonstrate an analysis method to directly extract the group delay rather than the phase from the white-light spectral interferogram. By the joint time-frequency analysis technique, group delay is directly read from the ridge of wavelet transform, and group-delay dispersion is easily obtained by additional differentiation. The technique shows reasonable potential for the characterization of ultra-broadband chirped mirrors.
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