Efficient Bragg diffraction in thin semiconductor two-dimensional gratings
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Updated: Jun 27, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
1Laboratoire Traitement et Communication de l'Information, CNRS et Institut Télécom, Télécom-ParisTech, dép. TSI, 46 rue Barrault, 75634 Paris Cedex 13, France.
Abstract:
Highly improved diffraction properties are demonstrated in a two-dimensional [2D] grating consisting of a transmission grating optically recorded in a semiconductor one-dimensional photonic crystal (1D-PC). Near unity internal diffraction efficiency, high wavelength selectivity, and Bragg diffraction regime operation are demonstrated when the read beam is set at Bragg incidence on the transmission grating while its wavelength corresponds to the band edge of the 3 microm thick 1D-PC. When the 2D grating is grown on a Bragg mirror, a single diffracted beam is obtained, which makes the device promising for optical signal processing.
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