You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jun 27, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
Shane Woody1, Bartosz Nowakowski, Marcin Bauza
1InsituTec Inc., 2750 East WT Harris Blvd., Suite 103, Charlotte, North Carolina 28213, USA.
This study shows a micrometer scale fiber sensor can act as miniaturized tweezers, picking up and releasing microscale glass objects. The sensor also detects release and provides data on mass and rotation.
09:45Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies
Published on: June 12, 2018
10:39Fabrication and Characterization of Thickness Mode Piezoelectric Devices for Atomization and Acoustofluidics
Published on: August 5, 2020
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: