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Mass Analyzers: Common Types01:19

Mass Analyzers: Common Types

The quadrupole mass analyzer consists of four cylindrical metal rods arranged in a diamond carrying a DC voltage and a radio-frequency AC voltage. The motion of ions through the quadrupole depends on the field strength, causing only ions of a certain m/z to resonate successfully and strike the detector at a given field strength. Though the transmission rate for these analyzers is high, the exact elemental composition of the sample is not determined because of low resolution; however, they are...
Mass Analyzers: Overview01:13

Mass Analyzers: Overview

The mass analyzer is a crucial component of the mass spectrometer. In the ionization chamber, the vaporized sample is bombarded with a high-energy electron beam to generate a radical cation and further fragment into neutral molecules, radicals, and cations. A series of negatively charged accelerator plates accelerate the cations into the mass analyzer. The mass analyzer separates ions according to their mass-to-charge (m/z) ratios and then directs them to the detector. The common types of mass...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Mass Spectrum: Interpretation01:24

Mass Spectrum: Interpretation

An unknown compound can be established by identifying the molecular ion peak in the mass spectrum. The molecular ion peak is often weak or absent due to the predominance of fragmentation in high-energy electron beams. In such cases, a soft-energy electron beam can be used to scan the spectrum to enhance the intensity of the molecular ion peak. Additionally, chemical ionization, field ionization, and desorption ionization spectra are used to obtain a relatively intense molecular ion peak.To...
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

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Updated: Jun 27, 2026

Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet (VUV) Synchrotron Radiation
09:53

Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet (VUV) Synchrotron Radiation

Published on: October 30, 2012

High resolution energy analyzer for broad ion beam characterization.

V Kanarov1, D Siegfried, P Sferlazzo

  • 1Veeco Instruments, Inc., Terminal Drive, Plainview, New York 11803, USA.

The Review of Scientific Instruments
|December 3, 2008
PubMed
Summary
This summary is machine-generated.

A new variable-focusing retarding field energy analyzer (RFEA) accurately measures low-energy broad ion beam energy distributions. This improved analyzer overcomes limitations of conventional methods for precise ion beam characterization.

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Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Related Experiment Videos

Last Updated: Jun 27, 2026

Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet (VUV) Synchrotron Radiation
09:53

Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet (VUV) Synchrotron Radiation

Published on: October 30, 2012

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Area of Science:

  • Plasma Physics and Diagnostics
  • Ion Beam Technology
  • Surface Science and Engineering

Background:

  • Conventional retarding field and deflection type energy analyzers struggle with characterizing low-energy, high-current density ion beams due to emittance and space-charge effects.
  • Existing methods face limitations in accurately determining the ion energy distribution function (IEDF) for broad ion beams.

Purpose of the Study:

  • To adapt and characterize a variable-focusing retarding field energy analyzer (RFEA) for accurate analysis of low-energy broad ion beams.
  • To overcome the limitations of conventional analyzers in measuring IEDF for such beams.

Main Methods:

  • Modification of a variable-focusing RFEA design, originally for electron beams, for broad ion beam analysis.
  • Incorporation of an orifice electrode for improved spatial resolution and reduced plasma density.
  • Use of an electron repeller grid to suppress secondary electrons and enhance measurement accuracy.
  • Employment of finer mesh retarding grids to minimize lens effects and improve energy resolution.

Main Results:

  • The modified RFEA successfully analyzed low-energy (
  • The inclusion of an orifice electrode and electron repeller grid critically enhanced performance.
  • Finer retarding grids further improved energy resolution and accuracy of the mean energy measurement.

Conclusions:

  • The optimized RFEA construction provides an energy resolution narrower than the beam's spectral width, yielding an accurate IEDF.
  • The developed RFEA is a robust tool for objective and accurate characterization of low-energy broad ion beam energy distributions.
  • Experimental and modeling results confirm the effectiveness of focusing voltage and retarding grid field optimization.