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Updated: Jun 27, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on: August 25, 2016

Demonstration of x-ray Thomson scattering using picosecond K-alpha x-ray sources in the characterization of dense

A L Kritcher1, P Neumayer, H J Lee

  • 1Lawrence Livermore National Laboratory, University of California, P.O. Box 808, Livermore, California 94551, USA. kritcher@berkeley.edu

The Review of Scientific Instruments
|December 3, 2008
PubMed

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