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Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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Related Experiment Video

Updated: Jun 27, 2026

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
11:03

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Published on: July 14, 2022

A flexible, highly stable electrochemical scanning probe microscope for nanoscale studies at the solid-liquid

A Z Stieg1, H I Rasool, J K Gimzewski

  • 1California NanoSystems Institute, 570 Westwood Plaza, Los Angeles, California 90095, USA.

The Review of Scientific Instruments
|December 3, 2008
PubMed
Summary

An ultrastable scanning probe microscope was developed for nanoscale studies in liquid environments. This instrument achieves high resolution and fast imaging, enabling detailed analysis of solid-liquid interfaces.

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Quantitative and Qualitative Examination of Particle-particle Interactions Using Colloidal Probe Nanoscopy
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Quantitative and Qualitative Examination of Particle-particle Interactions Using Colloidal Probe Nanoscopy

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Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
08:31

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

Published on: February 10, 2021

Related Experiment Videos

Last Updated: Jun 27, 2026

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
11:03

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Published on: July 14, 2022

Quantitative and Qualitative Examination of Particle-particle Interactions Using Colloidal Probe Nanoscopy
13:15

Quantitative and Qualitative Examination of Particle-particle Interactions Using Colloidal Probe Nanoscopy

Published on: July 18, 2014

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
08:31

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

Published on: February 10, 2021

Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Scanning probe microscopy (SPM) is crucial for nanoscale surface analysis.
  • Studying solid-liquid interfaces, especially in electrolytes, presents significant stability challenges.
  • Existing SPM systems often lack the required stability and flexibility for in situ electrochemical studies.

Purpose of the Study:

  • To design and fabricate an ultrastable SPM for nanoscale studies at the solid-liquid interface.
  • To quantify the noise limits, drift rates, and resonance frequencies of the microscope.
  • To demonstrate the microscope's capability for high-resolution imaging and spectroscopy in various environments.

Main Methods:

  • Detailed design and fabrication of a modular SPM system.
  • Quantification of system noise, mechanical drift (XY and Z), and mechanical resonance.
  • Measurement of closed-loop transfer functions under ambient and electrochemical conditions.
  • High-resolution atomic and molecular imaging using tunneling, tapping force (AM-AFM), and noncontact force (FM-AFM) modes.

Main Results:

  • System noise limits < or = 10 pA/Hz(1/2).
  • Mechanical drift rates of 2 nm/min (XY) and 0.15 nm/min (Z).
  • Lowest mechanical resonance at 7.9 kHz.
  • Linear feedback responses up to 4.2 kHz (ambient) and 2.5 kHz (electrochemical).
  • Atomic and molecular resolution imaging achieved at scan rates up to 80 lines/s.

Conclusions:

  • The developed ultrastable SPM offers exceptional performance for solid-liquid interface studies.
  • Its modular design provides high flexibility for various imaging and spectroscopic techniques.
  • The microscope enables high-speed, high-resolution nanoscale imaging in diverse electrochemical environments.