The study of surface segregation of Re(3)Pt polycrystalline alloy with photoelectron spectroscopy

The surface segregation and electronic structure of Re(3)Pt polycrystalline alloy were investigated via x-ray photoelectron spectroscopy (XPS). The results from angle-resolved core-level XPS show the enrichment of Pt at the top surface layer upon annealing at T=1200 K. The experimental results show excellent agreement with a theoretical model calculation, providing the element-specific depth profiles upon the high temperature annealing process. The presence of strong electron hybridization between Re and Pt is evident in the valence-band density-of-states ultraviolet photoemission spectra.