Growth of textured nanocrystalline cobalt ferrite thin films by pulsed laser deposition

Cobalt ferrite thin films have been deposited on fused quartz substrates by pulsed laser deposition at various substrate temperatures, T(s) (25 degrees C, 300 degrees C, 550 degrees C and 750 degrees C). Single phase, nanocrystalline, spinel cobalt ferrite formation is confirmed by X-ray diffraction (XRD) for T(s) > or = 300 degrees C. Conventional XRD studies reveal strong (111) texturing in the as deposited films with T(s) > or = 550 degrees C. Bulk texture measurements using X-ray orientation distribution function confirmed (111) preferred orientation in the films with T(s) > or = 550 degrees C. Grain size (13-16 nm for T(s) > or = 300 degrees C) estimation using grazing incidence X-ray line broadening analysis shows insignificant grain growth with increasing T(s), which is in good agreement with grain size data obtained from transmission electron microscopy.