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Friction measurements of InAs nanowires on silicon nitride by AFM manipulation

Gabriela Conache1, Struan M Gray, Aline Ribayrol

  • 1Center for Applied Mathematics and Physics, Halmstad University, Halmstad, Sweden. gabriela.conache@ftf.lth.se

Small (Weinheim an Der Bergstrasse, Germany)
|December 6, 2008
PubMed
Abstract

No abstract available in PubMed .

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Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...