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Updated: Jun 27, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
Published on: July 17, 2015
New epitaxial phase transition between DG and HEX in PS-b-PI
Hae-Woong Park1, Jueun Jung, Taihyun Chang
1Department of Chemistry and Polymer Research Institute, Pohang University of Science and Technology, Pohang, 790-784, Korea.
Abstract:
We investigated the epitaxial phase transition from double gyroid (DG) to hexagonally packed cylinder (HEX) phases of a polystyrene-b-polyisoprene diblock copolymer in a thin film on a Si wafer substrate. The internal structure of the thin film was investigated by grazing incidence small-angle X-ray scattering, transmission electron microscopy, and transmission electron microtomography (TEMT). TEMT allows observation of the 3D-image of coexisting DG and HEX directly. Good domain orientation in the thin film and direct 3D-imaging of TEMT made it possible to observe the coexisting phase of DG and HEX, and a new epitaxial transition path from DG to HEX was found.
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