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Updated: Jun 27, 2026

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
Published on: September 8, 2023
Udomchai Techavipoo1, John Lackey, Jianrong Shi
1Department of Radiology, Thomas Jefferson University, Philadelphia, Pennsylvania 19107, USA.
This study introduces a novel method for correcting geometric distortion in echo-planar imaging MRI scans. It eliminates the need for separate field map scans by using phase shifts derived directly from the acquired data, improving accuracy and efficiency.
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