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Updated: Jun 26, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
1Istituto Nazionale di Ricerca Metrologica, INRiM, Strada delle Cacce, 73, 10135 Torino, Italy. m.pisani@inrim.it
This study introduces a Michelson interferometer that enhances measurement resolution by multiplying the optical path length using multiple reflections. This technique significantly boosts precision, overcoming limitations in interferometric measurements.
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